JEITA EIAJ Standards (as of August in ). General System, Category and Title , Spec. No. (Test No.) Life Test, JEITA EIAJ ED/ Life TestⅠ, Steady. Japan Electronics and Information Technology Industries Association (JEITA) Standards EIAJ ED/ Environmental and endurance test methods for. EIAJ ED/ Test Method Ta=85°C, 85%RH, Vcc=80V, Vdd=6V. hrs. 0/ AC. EIAJ ED B Ta=°C,%RH.
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JEITA assumes absolutely no responsibility toward parties applying these standards or toward patent owners. Climatic 47011 methods C: The temperature of the air surrounding the specimen. JEITA ED is a standard for “environmental and endurance test methods for semiconductor devices”, and describes testing methods for evaluating semiconductor devices for industry and consumers.
Individual specifications on each test methods had been proposed in considering process, but this proposal was not realized. The semiconductor devices provided for the tests. Masashi Kusuda Mitsumi Electric Co. The junction temperature of the specimen. Electromagnetic compatibility wikipedialookup.
Semiconductor device wikipedialookup.
Reliability testing | SEIKO NPC CORPORATION
Mechanical test methods B: A new and old classification method is shown in Comment Table 1. No part of this standards may be reproduced in any form or by any means without prior permission in writing from the publisher.
The materials used to test the specimens. Because SiC does not have a long history as a semiconductor material, and because it does not have much of a track record compared with Si power devices, there may not be much awareness of the level of de reliability. Hence there are concerns about the possibility of a similar failure mode. JEITA standards are eiajj independently to any existing patents on the products, materials or processes they cover. Moreover, during the electrical measurements, the measurement conditions should not exceed the maximum ratings.
In particular, power devices are intended to handle large amounts of power, and so must attain satisfactory reliability. Reliability of SiC-SBDs Because SiC does not have a long history as a semiconductor material, and because it does not have much of a track record compared with Si power devices, there may not be much awareness of the level of its reliability.
Standard diagram and category are shown in Figure 9, and Table 1.
3-3 Standards Related to Reliability Test ｜Sanken Electric
The ambient temperature in operating state. Example, too many times and a few mistaking between the newest version and old version.
The equipment used to test the specimens. The ambient temperature when the specimen is stored in inoperative state. In conformity the relevant specifications when the specimen is cooled by forced convection. However, the reader can consider the data that we shall present below. Toru Katou Sanyo Electric Co.
The temperature at the reference point specified in the relevant specifications. The heating treatment, equivalent to the actual mounting by soldering, which the specimens are submitted to. Osamu Nakayama Kawasaki Microelectronics, Inc. The temperature on the surface of the specimen at the point specified in the relevant specifications.
The final revision planing was decided to above-mentioned 6 separate volumes. What are SiC Schottky barrier diodes? But, the new endurance test methods become to 2 kinds of specific test methods that are endurance test and intermittent operation life test. Kouji Obinata Sony Corp. Main revision points are as follow.
When evaluating semiconductor devices, in addition to the electrical and mechanical specifications and performance, reliability is another important factor. Atsushi Natsume Sony Corp. The 4 Appendixes confused the newest specification searching. Indicates the value under ordinary operating conditions. Junichi Mitsuhashi Mitsubishi Electric Corp. The standards related to integrated circuits IC and separate volume Appendix had been published, and the standards related to discrete devices SD separate volume Appendix and separate volume Appendix had been published.
Portable appliance testing wikipedialookup. Anyone who has studied the reliability of semiconductor devices and has actually performed evaluations will probably be familiar with these standards and conditions. Shizuo Kunita Sanken Electric Co. Thank you for your participation!
Nobuyuki Kawayoshi Sharp Corp. Tetsuji Matsuura Toshiba Corp. Toshiki Yamaguchi Fujitsu Ltd. Miscellaneous test methods 2 Endurance tests Test by devices D: